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Vishwakarma Institute of Technology, Pune

(An Autonomous Institute affiliated to Savitribai Phule Pune University)

Instrumentation Engineering Department
Presents

Third International Conference on Industry 4.0 2025
(I4Tech2025)

IEEE Conference Number: #64670









Registration Details for I4Tech2025


Registration Details for I4TECH2025 Conference

Indian Author (Amount in Rs.) Non-Indian Author (Amount in $)
Academia/ Industry IEEE member Rs. 7500 + (18% GST) = 8850 US $ 150
Academia/ Industry Non-IEEE Member Rs. 8500+ (18%GST) = 10030 US $ 175
Non-Author/Listener Rs. 5500 + (18% GST) = 6490 US $ 125
Additional Paper Rs. 5000 + (18% GST) = 5900 US $ 100

Process for registration and payment of fees for Indian Authors

  1. Participant should login on : https://learner.vierp.in/events
  2. Click on Signup
  3. Sign in using Gmail login and password.
  4. Go to ‘Event’ tab
  5. Choose the Organizing Institute from the dropdown menu. Select VIT, Pune
  6. Choose Event International Conference I4Tech2025 from the dropdown menu.
  7. Click on Pay fees.
  8. Select Payment Gateway “PAYTM” and proceed.
  9. Fill the Google form. Keep transaction id and screenshot of payment done ready before filling Google form: https://forms.gle/yZA24DaqiP7cMAM67
  10. Further instructions for copyright submission by registered authors will be communicated via email by conference team.
  11. Deadline for copyright form submission 30th July2025

The authors need to note the following important points for I4Tech2025 conference

  1. Only accepted, registered and presented papers will be submitted to IEEE for possible inclusion on IEEE Xplore
  2. During presentation, if session chairs deny paper for lack of novelty such paper will not be sent further for possible inclusion on IEEE Xplore
  3. It is sole responsibility of the authors to ensure plagiarism is less that 10% and AI generated writing zero percent. During camera-ready paper submission if more than 10% plagiarism and AI generated writing is detected, paper will not be submitted for possible inclusion on IEEE Xplore.
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